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Patch-to-Global: Random Patch Diffusion for Globally Consistent Megapixel Artifact Inpainting in Whole Slide Images
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Hyeseong Lee, Eunsu Kim, D M Bappy, Ho Heon Kim, Youngsuk Lee, Se Young Chun, Jang-Hwan Choi, Sung Hak Lee, Sangjeong Ahn

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ResearcharXiv cs.CV

Patch-to-Global: Random Patch Diffusion for Globally Consistent Megapixel Artifact Inpainting in Whole Slide Images

arXiv:2609.24116v1 Announce Type: new Abstract: Although deep learning has advanced Whole Slide Image (WSI) Analysis, tissue artifacts like bubbles and folds often cause silent failures by concealing essential morphology. Current pathology image restoration methods are mostly restricted to small patches, struggling to maintain global structural coherence at a megapixel scale. We introduce RestorePath, a framework for globally consistent megapixel scale inpainting that reconstructs diagnostic structures in histological image to prevent incorrect high-confidence predictions and lower error rates. Our model utilizes a Latent Diffusion Model (LDM) conditioned on Pathology Foundation Model (PFM) embeddings, integrating Large Kernel Attention (LKA) to manage long-range dependencies during random patch diffusion. Enhanced by Distance-Weighted Interpolation (DWI) and an Adaptive Guidance Scale (AGS), RestorePath ensures structural consistency and fidelity by modulating information from surrounding patches. Evaluations across TCGA-BRCA, BACH, and Camelyon16 datasets for images ranging from 512 to 4608 pixels demonstrate state-of-the-art performance in maintaining histological consistency. RestorePath significantly improves downstream Computational Pathology (CP) tasks, outperforming both raw artifact images and the conventional Detect-and-Discard (D&D) approach. The code is available at https://github.com/PathfinderLab/RestorePath

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This story was published by arXiv cs.CV and written by Hyeseong Lee, Eunsu Kim, D M Bappy, Ho Heon Kim, Youngsuk Lee, Se Young Chun, Jang-Hwan Choi, Sung Hak Lee, Sangjeong Ahn. SyncAI.news shows a preview; the complete article is on the publisher's site.

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